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Features
- Real-time crystal frequency, mass and conductance
measurement
- Graphing & data logging software
- Measures up to three crystals simultaneously
- <0.4ng/cm2 measurement resolution
- Onboard data acquisition
- Control inputs & outputs
- 3.8 to 6MHz or 5.1 to 10MHz frequency range
- Supports heavily loaded crystals
- Capacitance cancellation
- Electrically isolated crystal electrode
For Specifications:
Please
request a brochure for full technical specifications.
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The RQCM is a highly advanced method of
measuring film properties during processes such as deposition, dissolution
or permeation. it is possible to measure up to three crystals
simultaneously with <0.4 ng.cm2 mass resolution. All data is
logged and graphically displayed using custom WindowsTM based
software in real time.
At the
heart of the RQCM is a high performance phase lock oscillator with
measurement stability from 3.8 to 10 MHz. The circuit also incorporates
adjustable crystal capacitance cancellation, reducing error caused by
parasitic capacitance of the crystal. This is essential for accurate
measurement of lossy (soft) films.
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