Crystal Frequency, Mass and Resistance Measurement
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RQCM is a highly advanced method of measuring film properties during processes such as deposition, dissolution or permeation. Up to three crystals can be measured simultaneously with <0.4 ng/cm 2 mass resolution. All data is logged and graphically displayed using integrated Windows-based software in real time.
Features at a Glance
ASSOCIATED TECHNICAL INFORMATION
Brochures and Datasheets:
Brochure - Maxtek Crystal Holders/Flow Cell/Glass Cel
Brochure - Maxtek RQCM Quartz Crystal Microbalance Research System
Operations and Maintenance Manuals:
Instruction Sheet - How to Install a Crystal
Instruction Sheet - Probe Maintenance
Maintenance and Installation Manual - CHC-15 Crystal Holders, GC-15 Glass Cell Cell
Operating Manual - RQCM Quartz Crystal Microbalance Research System
Software:
Software - RQCM_DATALOGGER_V2.0.3
Technical Information:
Technical Note - RQCM Software; Run-Time Error '35603': Invalid Key
Technical Note: Communications Checklist - RS-232
Technical Note: Dynamically Adjusted Measurement Update Rate