Maxtek RQCM Quartz Crystal Microbalance
Research System

RQCM is a highly advanced method of measuring film properties during processes such as deposition, dissolution or permeation. Up to three crystals can be measured simultaneously with <0.4 ng/cm² mass resolution. All data is logged and graphically displayed using integrated Windows®-based software in real time.

Features at a Glance

• Measures up to three crystals simultaneously
• <0.4 ng/cm² measurement resolution
• Frequency range: 3.8 to 6 MHz, 5.1 to 10 MHz
• Supports heavily loaded crystals
• Capacitance cancellation
• Electrically isolated crystal electrode
• Onboard data acquisition
• Control inputs and outputs
• Integrated Windows-based software included

You can view and print articles by clicking on the Adobe PDF icon or order free product information, application bulletins, and technical papers by selecting items from the list below with the check boxes and clicking on the Continue button at the bottom of the page.

• Brochure - Maxtek RQCM Quartz Crystal Microbalance Research System
• Dynamically Adjusted Measurement Update Rate
• Maxtek RQCM Software (v2.0)
• RQCM Software; Run-Time Error '35603': Invalid Key
• RS-232 Communications Checklist